Vinkkaa tuotetta kavereillesi:
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing Kumar, Ch Sateesh (University of Johannesburg, South Africa)
Hinta
€ 57,49
Tilattu etävarastosta
Arvioitu toimitus ti 30. joulu - pe 2. tammi 2026
Joululahjoja voi vaihtaa 31.1. asti
Lisää iMusic-toivelistallesi
tai
Löytyy myös muodossa:
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing
Kumar, Ch Sateesh (University of Johannesburg, South Africa)
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black
| Media | Kirjat Paperback Book (Kirja pehmeillä kansilla ja liimatulla selällä) |
| Julkaisupäivämäärä | perjantai 29. marraskuuta 2024 |
| ISBN13 | 9781032375113 |
| Tuottaja | Taylor & Francis Ltd |
| Sivujen määrä | 130 |
| Mitta | 234 × 156 × 11 mm · 238 g |
| Kieli | Englanti |
