Electron Beam Lithography Process Optimization - Linfei Gu - Kirjat - GRIN Verlag - 9783656083160 - sunnuntai 18. joulukuuta 2011
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Electron Beam Lithography Process Optimization

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Technical Report from the year 2011 in the subject Design (Industry, Graphics, Fashion), grade: -, University of Southern California, language: English, abstract: Currently, nanowires have aroused intensive attention due to their interesting electric and optical properties as well as potentially wide application (For example, nanowires can be used as a promising structure for transistor channels). For compound semiconductor nanowires, Nanoscale Selective Area MOCVD (Metalorganic Chemical Vapor Deposition), or NS?SAG, is a very attractive growth technique for the fabrication of sophisticated nanowire structure, because by using this technique, diameter and location of wires are controllable, with no incorporation of unwanted metals. It is achieved by deposition of a nano?openingarray ?patterned dielectric mask above the substrate. Since crystals cannot be formed on dielectric mask, nanowire growth only occurs at openings, with desired diameters and locations, as shown in Fig 1. Pattern of nano opening arrays is of vital importance since it governs the size, location and density of nanowires as wells as growth rate and behavior.

Media Kirjat     Paperback Book   (Kirja pehmeillä kansilla ja liimatulla selällä)
Julkaisupäivämäärä sunnuntai 18. joulukuuta 2011
ISBN13 9783656083160
Tuottaja GRIN Verlag
Sivujen määrä 36
Mitta 138 × 2 × 213 mm   ·   45 g
Kieli Saksa