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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 2008 edition
Mohammad Tehranipoor
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Arvioitu toimitus ma - ke 16. - 25. kesä
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 2008 edition
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
424 pages, 1, black & white illustrations
| Media | Kirjat Hardcover Book (Sidottu kirja kovilla kansilla sekä suojakannella) |
| Julkaisupäivämäärä | maanantai 10. joulukuuta 2007 |
| ISBN13 | 9780387747460 |
| Tuottaja | Springer-Verlag New York Inc. |
| Sivujen määrä | 408 |
| Mitta | 155 × 235 × 23 mm · 811 g |
| Kieli | English |
| Toimittaja | Tehranipoor, Mohammad |
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