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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1. Painos
Raimund Ubar
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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) 1. Painos
Raimund Ubar
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.
Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.
Media | Kirjat Hardcover Book (Sidottu kirja kovilla kansilla sekä suojakannella) |
Julkaisupäivämäärä | torstai 31. maaliskuuta 2011 |
ISBN13 | 9781609602123 |
Tuottaja | IGI Global |
Sivujen määrä | 578 |
Mitta | 218 × 284 × 36 mm · 1,61 kg |
Kieli | English |
Mukana | Heinrich Theodor Vierhaus |
Mukana | Jaan Raik |
Mukana | Raimund Ubar |
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