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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition
Mohammad Tehranipoor
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
422 pages, black & white illustrations
| Media | Kirjat Paperback Book (Kirja pehmeillä kansilla ja liimatulla selällä) |
| Julkaisupäivämäärä | tiistai 23. marraskuuta 2010 |
| ISBN13 | 9781441945136 |
| Tuottaja | Springer-Verlag New York Inc. |
| Sivujen määrä | 408 |
| Mitta | 155 × 235 × 21 mm · 589 g |
| Kieli | English |
| Toimittaja | Tehranipoor, Mohammad |
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