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Electromigration Modeling at Circuit Layout Level - SpringerBriefs in Reliability 2013 edition
Cher Ming Tan
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Electromigration Modeling at Circuit Layout Level - SpringerBriefs in Reliability 2013 edition
Cher Ming Tan
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.
120 pages, 73 black & white illustrations, 2 colour illustrations, biography
| Media | Kirjat Paperback Book (Kirja pehmeillä kansilla ja liimatulla selällä) |
| Julkaisupäivämäärä | lauantai 4. toukokuuta 2013 |
| ISBN13 | 9789814451208 |
| Tuottaja | Springer Verlag, Singapore |
| Sivujen määrä | 103 |
| Mitta | 155 × 235 × 6 mm · 1,88 kg |
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